High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data

A. Steuwer, J. R. Santisteban, M. Turski, P. J. Withers, T. Buslaps
  • Journal of Applied Crystallography, November 2004, International Union of Crystallography
  • DOI: 10.1107/s0021889804023349

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http://dx.doi.org/10.1107/s0021889804023349

The following have contributed to this page: Professor Philip J Withers