Depth capabilities of neutron and synchrotron diffraction strain measurement instruments. II. Practical implications

Philip John Withers
  • Journal of Applied Crystallography, July 2004, International Union of Crystallography
  • DOI: 10.1107/s0021889804012750

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http://dx.doi.org/10.1107/s0021889804012750

The following have contributed to this page: Professor Philip J Withers