The precision of diffraction peak location

Philip J. Withers, Mark R. Daymond, Michael W. Johnson
  • Journal of Applied Crystallography, November 2001, International Union of Crystallography
  • DOI: 10.1107/s002188980101411x

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http://dx.doi.org/10.1107/s002188980101411x

The following have contributed to this page: Professor Philip J Withers