Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

  • Arman Davtyan, Sebastian Lehmann, Dominik Kriegner, Reza R. Zamani, Kimberly A. Dick, Danial Bahrami, Ali Al-Hassan, Steven J. Leake, Ullrich Pietsch, Václav Holý
  • Journal of Synchrotron Radiation, August 2017, International Union of Crystallography
  • DOI: 10.1107/s1600577517009584

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http://dx.doi.org/10.1107/s1600577517009584

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