Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

• Arman Davtyan, Sebastian Lehmann, Dominik Kriegner, Reza R. Zamani, Kimberly A. Dick, Danial Bahrami, Ali Al-Hassan, Steven J. Leake, Ullrich Pietsch, Václav Holý

• Journal of Synchrotron Radiation, August 2017, International Union of Crystallography
• DOI: 10.1107/s1600577517009584