What is it about?

Some materials contain large amount of amorphous nanoparticles that may influence the character of the materials, but these nanoparticles had been neglected in many cases because we did not have method to measure the amount of the amorphous nanoparticles. We have deviced the method to measure the amount of amorphous nanoparticles with an x-ray small-angle scattering method.

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Why is it important?

Amorphous nanoparticles have been observed with an electron microscope, but the electron microscope cannot determine the amount of the amorphous nanoparticles. The x-ray small angle scattering method we have deviced can determine the amount of amorphous nanoparticls.

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This page is a summary of: Quantifying nanoparticles in clays and soils with a small-angle X-ray scattering method, Journal of Applied Crystallography, February 2020, International Union of Crystallography, DOI: 10.1107/s1600576719017266.
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