Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Soundes Djaziri, Pierre-Olivier Renault, François Hild, Eric Le Bourhis, Philippe Goudeau, Dominique Thiaudière, Damien Faurie
  • Journal of Applied Crystallography, September 2011, International Union of Crystallography
  • DOI: 10.1107/s0021889811030226
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