Quantitative analysis of density-dependent transport in tetramethyltetraselenafulvalene single-crystal transistors: Intrinsic properties and trapping

H. Xie, H. Alves, A. F. Morpurgo
  • Physical Review B, December 2009, American Physical Society (APS)
  • DOI: 10.1103/physrevb.80.245305

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http://dx.doi.org/10.1103/physrevb.80.245305

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