Critical behavior of strained epitaxial Gd films: In situ ac-susceptibility measurements in UHV

  • W. G. Clark, U. Stetter, M. Farle, K. Baberschke
  • January 1992, American Physical Society (APS)
  • DOI: 10.1103/physrevb.45.503

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Michael Farle