Publication not explained

This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.

If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.

Featured Image

Read the Original

This page is a summary of: Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope, Journal of Physics Conference Series, November 2011, Institute of Physics Publishing,
DOI: 10.1088/1742-6596/326/1/012028.
You can read the full text:

Read

Contributors

The following have contributed to this page