Towards in-process x-ray CT for dimensional metrology

Jason M Warnett, Valeriy Titarenko, Ercihan Kiraci, Alex Attridge, William R B Lionheart, Philip J Withers, Mark A Williams
  • Measurement Science and Technology, January 2016, Institute of Physics Publishing
  • DOI: 10.1088/0957-0233/27/3/035401

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The following have contributed to this page: Professor Philip J Withers