CCD image sensor induced error in PIV applications

M Legrand, J Nogueira, A A Vargas, R Ventas, M C Rodríguez-Hidalgo
  • Measurement Science and Technology, May 2014, Institute of Physics Publishing
  • DOI: 10.1088/0957-0233/25/6/065207

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The following have contributed to this page: Mathieu Legrand