Finite-size effects and analytical modeling of electrostatic force microscopy applied to dielectric films

G Gomila, G Gramse, L Fumagalli
  • Nanotechnology, June 2014, Institute of Physics Publishing
  • DOI: 10.1088/0957-4484/25/25/255702

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http://dx.doi.org/10.1088/0957-4484/25/25/255702