Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement

  • Ronghua Zhu, Huimin Xie, Yunfei Xue, Liang Wang, YanJie Li
  • Measurement Science and Technology, July 2015, Institute of Physics Publishing
  • DOI: 10.1088/0957-0233/26/9/095601

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http://dx.doi.org/10.1088/0957-0233/26/9/095601