Characterization of SEM speckle pattern marking and imaging distortion by digital image correlation

Adrien Guery, Félix Latourte, François Hild, Stéphane Roux
  • Measurement Science and Technology, November 2013, Institute of Physics Publishing
  • DOI: 10.1088/0957-0233/25/1/015401
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The following have contributed to this page: Dr Francois Hild