Compound formation and large microstrains at the interface of II-VI/III-V semiconductors detected by Raman spectroscopy

A Krost, W Richter, D R T Zahn, O Brafman
  • Semiconductor Science and Technology, September 1991, Institute of Physics Publishing
  • DOI: 10.1088/0268-1242/6/9a/020

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http://dx.doi.org/10.1088/0268-1242/6/9a/020

The following have contributed to this page: Professor Dietrich RT Zahn