Violation of the rate-window concept in the charge deep-level transient spectroscopy using second-order filtering

I Thurzo, D R T Zahn, A K Dua
  • Semiconductor Science and Technology, April 2002, Institute of Physics Publishing
  • DOI: 10.1088/0268-1242/17/5/309

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http://dx.doi.org/10.1088/0268-1242/17/5/309

The following have contributed to this page: Professor Dietrich RT Zahn