Experimental evidence for complementary spatial sensitivities of capacitance and charge deep-level transient spectroscopies

I Thurzo, R Beyer, D R T Zahn
  • Semiconductor Science and Technology, March 2000, Institute of Physics Publishing
  • DOI: 10.1088/0268-1242/15/4/312
The author haven't finished explaining this publicationThe author haven't finished explaining this publication

The following have contributed to this page: Professor Dietrich RT Zahn