Experimental evidence for complementary spatial sensitivities of capacitance and charge deep-level transient spectroscopies

I Thurzo, R Beyer, D R T Zahn
  • Semiconductor Science and Technology, March 2000, Institute of Physics Publishing
  • DOI: 10.1088/0268-1242/15/4/312

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http://dx.doi.org/10.1088/0268-1242/15/4/312

The following have contributed to this page: Professor Dietrich RT Zahn