What is it about?
A new process capability index (PCI) control chart for monitoring the process mean using repetitive sampling is presented. The design of the proposed control chart is based on an unbiased estimator σ ̂=s ̅/c_4 of the process standard deviation for a normally distributed quality characteristic. The formulae for the in-control and out-of-control average run length and the standard deviation of the run length (SDRL) are derived. Tables of in-control and out-of-control average run length (ARL) and standard deviation of the run length (SDRL) for various shifts, δ are presented.
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Why is it important?
The proposed control chart outperforms existing control chart in detecting relatively small process mean shifts in terms of ARLs and SDRLs.
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This page is a summary of: Capability index-based control chart for monitoring process mean using repetitive sampling, Communication in Statistics- Theory and Methods, September 2017, Taylor & Francis,
DOI: 10.1080/03610926.2017.1307401.
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