Electrical analyses of charge trapping and stress-induced leakage current in CeO2gate dielectric

Fu-Chien Chiu, Shu-Hao Chang
  • Journal of the Chinese Institute of Engineers, July 2013, Taylor & Francis
  • DOI: 10.1080/02533839.2013.799927

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http://dx.doi.org/10.1080/02533839.2013.799927