Space-Filling Designs for Robustness Experiments

  • V. Roshan Joseph, Li Gu, Shan Ba, William R. Myers
  • Technometrics, March 2018, Taylor & Francis
  • DOI: 10.1080/00401706.2018.1451390

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http://dx.doi.org/10.1080/00401706.2018.1451390