An area efficient, high-frequency digital built-in self-test for analogue to digital converter

M. Senthil Sivakumar, S. P. Joy Vasantha Rani
  • International Journal of Electronics, February 2018, Taylor & Francis
  • DOI: 10.1080/00207217.2018.1440431

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http://dx.doi.org/10.1080/00207217.2018.1440431

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