Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Featured Image
Read the Original
This page is a summary of: Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source, Review of Scientific Instruments, February 2019, American Institute of Physics,
DOI: 10.1063/1.5057441.
You can read the full text:
Contributors
The following have contributed to this page