Simulation of thickness and optical constants from transmission spectrum of thin film by envelope method: Practical constraints and their solution

Sekh Maidul, D. D. Shinde, J. S. Misal, Nisha Prasad, P. R. Sagdeo, N. K. Sahoo
  • January 2012, American Institute of Physics
  • DOI: 10.1063/1.4732400

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The following have contributed to this page: Professor Pankaj R Sagdeo