Transport-mechanism analysis of the reverse leakage current in GaInN light-emitting diodes

  • Qifeng Shan, David S. Meyaard, Qi Dai, Jaehee Cho, E. Fred Schubert, Joong Kon Son, Cheolsoo Sone
  • Applied Physics Letters, December 2011, American Institute of Physics
  • DOI: 10.1063/1.3668104

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http://dx.doi.org/10.1063/1.3668104

The following have contributed to this page: Professor Jaehee Cho