On the temperature dependence of electron leakage from the active region of GaInN/GaN light-emitting diodes

  • David S. Meyaard, Qifeng Shan, Qi Dai, Jaehee Cho, E. Fred Schubert, Min-Ho Kim, Cheolsoo Sone
  • Applied Physics Letters, July 2011, American Institute of Physics
  • DOI: 10.1063/1.3618673

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http://dx.doi.org/10.1063/1.3618673

The following have contributed to this page: Professor Jaehee Cho