Low-energy electron point source microscope with position-sensitive electron energy analyzer

Jeong-Young Park, S. H. Kim, Y. D. Suh, W. G. Park, Y. Kuk
  • Review of Scientific Instruments, November 1999, American Institute of Physics
  • DOI: 10.1063/1.1150070

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http://dx.doi.org/10.1063/1.1150070

The following have contributed to this page: Dr Sang Hoon Kim