What is it about?
Low-defect materials are critical in many applications, from optics to semiconductors, to coatings. Assessing the quality of these materials can be difficult and often must be customized for specific applications. This paper demonstrates the use of a thermal technique for the physical and chemical characterization of reflective samples with high resolution and high throughput.
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Why is it important?
Our findings suggest the application of this technique for use in the high-resolution characterization of any reflective sample, as the sensitivity of thermoreflectance is much higher than traditional optical imaging.
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This page is a summary of: Characterization of AlF3-passivated aluminum mirrors using non-contact thermal metrology, Review of Scientific Instruments, February 2025, American Institute of Physics,
DOI: 10.1063/5.0241547.
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