What is it about?
It is about thermal noise study in AFM microcantilevers and capturing high-resolution nm AFM images.
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Why is it important?
Lowering the noise level in active microcantilevers has been one of the goals in this area for decades. We were able to lower the noise level close to optical sensors.
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This page is a summary of: High resolution atomic force microscopy with an active piezoelectric microcantilever, Review of Scientific Instruments, July 2022, American Institute of Physics,
DOI: 10.1063/5.0090668.
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