Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Read the Original
This page is a summary of: Atomic-scale quantitative analysis of implanted Mg in annealed GaN layers on free-standing GaN substrates, Journal of Applied Physics, December 2019, American Institute of Physics, DOI: 10.1063/1.5132345.
You can read the full text:
The following have contributed to this page