Bulk lifetime characterization of corona charged silicon wafers with high resistivity by means of microwave detected photoconductivity

C. R. Engst, M. Rommel, C. Bscheid, I. Eisele, C. Kutter
  • Journal of Applied Physics, December 2017, American Institute of Physics
  • DOI: 10.1063/1.4993127
The author haven't finished explaining this publicationThe author haven't finished explaining this publication

The following have contributed to this page: Dr. Mathias Rommel