Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

M. S. Dunaevskiy, P. A. Alekseev, A. N. Baranov, A. M. Monakhov, R. Teissier, R. Arinero, P. Girard, A. N. Titkov
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4817677
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