Effect of conductive atomic force microscope tip loading force on tip-sample interface electronic characteristics: Unipolar to bipolar resistive switching transition

  • Bharti Singh, Deepak Varandani, B. R. Mehta
  • Applied Physics Letters, July 2013, American Institute of Physics
  • DOI: 10.1063/1.4817380

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http://dx.doi.org/10.1063/1.4817380

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