Optical absorption in silicon layers in the presence of charge inversion/accumulation or ion implantation

L. Alloatti, M. Lauermann, C. Sürgers, C. Koos, W. Freude, J. Leuthold
  • Applied Physics Letters, July 2013, American Institute of Physics
  • DOI: 10.1063/1.4817255
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The following have contributed to this page: Dr Christoph Sürgers