Evidence of deep traps in overgrown v-shaped defects in epitaxial GaN layers

  • P. H. Weidlich, M. Schnedler, H. Eisele, U. Strauß, R. E. Dunin-Borkowski, Ph. Ebert
  • Applied Physics Letters, August 2013, American Institute of Physics
  • DOI: 10.1063/1.4816969

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http://dx.doi.org/10.1063/1.4816969

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