Graphene-metal contact resistivity on semi-insulating 6H-SiC(0001) measured with Kelvin probe force microscopy

  • Thomas Druga, Martin Wenderoth, Felix Lüpke, Rainer G. Ulbrich
  • Applied Physics Letters, July 2013, American Institute of Physics
  • DOI: 10.1063/1.4816955

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http://dx.doi.org/10.1063/1.4816955

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