Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

X. H. Kong, H. X. Ji, R. D. Piner, H. F. Li, C. W. Magnuson, C. Tan, A. Ismach, H. Chou, R. S. Ruoff
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4816752
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