Investigation of tow-step electrical degradation behavior in a-InGaZnO thin-film transistors with Sm2O3 gate dielectrics

  • Fa-Hsyang Chen, Jim-Long Her, Meng-Ning Hung, Tung-Ming Pan
  • Applied Physics Letters, July 2013, American Institute of Physics
  • DOI: 10.1063/1.4816057

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http://dx.doi.org/10.1063/1.4816057

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