Incident photon-to-current efficiency measurements as a helpful tool to analyze luminescence loss mechanisms in organic light-emitting diodes

  • R. Huber, H. Borchert, E. von Hauff, S. Heun, H. Buchholz, J. Parisi
  • Applied Physics Letters, July 2013, American Institute of Physics
  • DOI: 10.1063/1.4816039

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http://dx.doi.org/10.1063/1.4816039

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