Optical properties of AlAsxSb1−x alloys determined by in situ ellipsometry

  • J. Y. Kim, J. J. Yoon, T. J. Kim, Y. D. Kim, E. H. Lee, M. H. Bae, J. D. Song, W. J. Choi, C.-T. Liang, Y.-C. Chang
  • Applied Physics Letters, July 2013, American Institute of Physics
  • DOI: 10.1063/1.4812834

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http://dx.doi.org/10.1063/1.4812834

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