Resistive switching with self-rectifying behavior in Cu/SiOx/Si structure fabricated by plasma-oxidation

G. S. Tang, F. Zeng, C. Chen, H. Y. Liu, S. Gao, S. Z. Li, C. Song, G. Y. Wang, F. Pan
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4812318