The impact of negative oxygen ion bombardment on electronic and structural properties of magnetron sputtered ZnO:Al films

  • André Bikowski, Thomas Welzel, Klaus Ellmer
  • Applied Physics Letters, June 2013, American Institute of Physics
  • DOI: 10.1063/1.4811647

The authors haven't yet claimed this publication.

Read Publication

In partnership with:

Link to American Institute of Physics showcase