Lateral heat diffusion investigation of a layered structure: Application to the complete thermal characterization of a lithium phosphorous oxynitride film

F. Xu, C. Frétigny, D. Fournier, L. Belliard, S. Vincent, B. Perrin, S. Martin, C. Secouard, J.-Y. Duquesne
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4811520