Systematic study of interface trap and barrier inhomogeneities using I-V-T characteristics of Au/ZnO nanorods Schottky diode

I. Hussain, M. Y. Soomro, N. Bano, O. Nur, M. Willander
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4810924
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