Microstructure evolution during the isostructural decomposition of TiAlN—A combined in-situ small angle x-ray scattering and phase field study

A. Knutsson, J. Ullbrand, L. Rogström, N. Norrby, L. J. S. Johnson, L. Hultman, J. Almer, M. P. Johansson Jöesaar, B. Jansson, M. Odén
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4809573
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