Boron- and phosphorus-doped polycrystalline silicon thin films prepared by silver-induced layer exchange

T. Antesberger, T. A. Wassner, C. Jaeger, M. Algasinger, M. Kashani, M. Scholz, S. Matich, M. Stutzmann
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4808024