In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample

  • John M. Gregoire, Kechao Xiao, Patrick J. McCluskey, Darren Dale, Gayatri Cuddalorepatta, Joost J. Vlassak
  • Applied Physics Letters, May 2013, American Institute of Physics
  • DOI: 10.1063/1.4806972

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http://dx.doi.org/10.1063/1.4806972

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