Determination of stress, strain, and elemental distribution within In(Ga)As quantum dots embedded in GaAs using advanced transmission electron microscopy

N. Cherkashin, S. Reboh, M. J. Hÿtch, A. Claverie, V. V. Preobrazhenskii, M. A. Putyato, B. R. Semyagin, V. V. Chaldyshev
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4804380
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The following have contributed to this page: Nikolay Cherkashin and Shay Reboh