Determination of stress, strain, and elemental distribution within In(Ga)As quantum dots embedded in GaAs using advanced transmission electron microscopy

  • N. Cherkashin, S. Reboh, M. J. Hÿtch, A. Claverie, V. V. Preobrazhenskii, M. A. Putyato, B. R. Semyagin, V. V. Chaldyshev
  • Applied Physics Letters, April 2013, American Institute of Physics
  • DOI: 10.1063/1.4804380

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http://dx.doi.org/10.1063/1.4804380

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