Improved contact resistivity and intra-die variation in organic thin film transistors

  • S. Pankalla, D. Spiehl, H. M. Sauer, E. Dörsam, M. Glesner
  • Applied Physics Letters, April 2013, American Institute of Physics
  • DOI: 10.1063/1.4804239

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http://dx.doi.org/10.1063/1.4804239

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