Photo-pseudo-metal–oxide–semiconductor field effect transistor for characterization of surface recombination in silicon on insulator materials

M. Daanoune, A. Diab, S. Sirajeddine, A. Kaminski-Cachopo, I. Ionica, G. Papaioannou, S. Cristoloveanu
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4804064
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