Temperature-dependent optical properties of epitaxial CdO thin films determined by spectroscopic ellipsometry and Raman scattering

S. G. Choi, L. M. Gedvilas, S. Y. Hwang, T. J. Kim, Y. D. Kim, J. Zúñiga-Pérez, V. Muñoz Sanjosé
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4803876